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Volumn 7735, Issue PART 1, 2010, Pages
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Automated characterization of CCD detectors for DECam
a b b a b a c a a d a a a a a e a f g a more.. |
Author keywords
[No Author keywords available]
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Indexed keywords
CCD DETECTORS;
CHARGE TRANSFER EFFICIENCY;
COLD PROBE;
COMPREHENSIVE TESTING;
DARK ENERGY;
FULL WELL CAPACITY;
MULTI-STAGE TESTING;
TECHNICAL REQUIREMENT;
TECHNICAL SPECIFICATIONS;
TEST DATA;
TEST RESULTS;
TIME-CONSUMING TASKS;
ASTROPHYSICS;
CHARGE TRANSFER;
ION EXCHANGE;
SURVEYS;
TESTING;
INSTRUMENTS;
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EID: 78149249580
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.864472 Document Type: Conference Paper |
Times cited : (7)
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References (7)
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