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Materials Transactions

Volumn 51, Issue 9, 2010, Pages 1677-1682

Wetting transition of grain boundaries in tin-rich indium-based alloys and its influence on electrical properties

(3) Yeh, Chien Hsuan a Chang, Li Shin a Straumal, Boris b

a NATIONAL CHUNG HSING UNIVERSITY (Taiwan)

b INSTITUTE OF SOLID STATE PHYSICS (Russian Federation)

Author keywords

Electrical conductivity; Grain boundaries; Grain boundary wetting phase transition; Microstructure; Tin indium alloy

Indexed keywords

ANNEALING TEMPERATURES; ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTY; EUTECTIC TRANSFORMATION; GRAIN BOUNDARY TRIPLE JUNCTIONS; GRAIN BOUNDARY WETTING PHASE TRANSITION; GRAIN-BOUNDARY WETTING; TIN CONTENT; TWO-PHASE REGION; WETTING TRANSITIONS; XRD;

ANNEALING; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INDIUM; MICROSTRUCTURE; PHASE DIAGRAMS; PHASE TRANSITIONS; TIN; TIN ALLOYS; WETTING;

INDIUM ALLOYS;

EID: 78049500722 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.M2010159 Document Type: Article

Times cited : (11)

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