Hollow-cone dark-field transmission electron microscopy for dislocation density characterization of trimodal Al composites

Micron

Volumn 42, Issue 1, 2011, Pages 29-35

  Yao, Bo ^a   Heinrich, Helge ^b   Smith, Cory ^c   van den Bergh, Mark ^c   Cho, Kyu ^d   Sohn, Yong Ho ^a  

^a University of Central Florida   (United States)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

^c DWA Aluminum Composites   (United States)

^d U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

Dislocation density; Hollow cone dark field; Nanocrystalline; Transmission electron microscopy; Two beam condition

Indexed keywords

BEAM CONDITIONS; DISLOCATION DENSITIES; HOLLOW-CONE DARK-FIELD; NANOCRYSTALLINES; TRANSMISSION ELECTRON;

CONDUCTIVE FILMS; DUCTILITY; ELECTRONS; METALLIC MATRIX COMPOSITES; NANOCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM;

EID: 78049471473     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2010.08.010     Document Type: Article

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