Power spectral density measurement for large aspheric surfaces

Frontiers of Optoelectronics in China

Volumn 1, Issue 1-2, 2008, Pages 197-200

  Chen, Wei ^a   Yao, Hanmin ^b   Wu, Fan ^b   Wu, Shibin ^b   Chen, Qiang ^b  

^a XI'AN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b INSTITUTE OF OPTICS AND ELECTRONICS   (China)

Author keywords

large aspheric; optic testing; power spectral density (PSD)

Indexed keywords

EID: 78049412115     PISSN: 16744128     EISSN: 16744594     Source Type: Journal    
DOI: 10.1007/s12200-008-0032-2     Document Type: Article

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