Finite-difference time-domain analysis of scanning tunneling microscope light emission spectra

Japanese Journal of Applied Physics

Volumn 49, Issue 9 PART 1, 2010, Pages

  Iida, Wataru ^a   Katano, Satoshi ^a   Uehara, Yoichi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC THEORY; FDTD ANALYSIS; FDTD METHOD; FINITE DIFFERENCE TIME DOMAIN ANALYSIS; LATERAL SIZES; LIGHT EMISSION SPECTRA; LOCALIZED SURFACE PLASMON; RADIUS OF CURVATURE; SCANNING TUNNELING MICROSCOPES; SPECTRAL ANALYSIS; SPECTRAL FEATURE; SPECTRAL SHAPES;

DISKS (STRUCTURAL COMPONENTS); EMISSION SPECTROSCOPY; FINITE DIFFERENCE TIME DOMAIN METHOD; FORECASTING; MICROSCOPES; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS;

LIGHT EMISSION;

EID: 78049397102     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.095202     Document Type: Article

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