-
1
-
-
84892351987
-
-
Springer, Heidelberg
-
Pohl, K., Böckle, G., van der Linden, F.: Software Product Line Engineering - Foundations, Principles, and Techniques. Springer, Heidelberg (2005)
-
(2005)
Software Product Line Engineering - Foundations, Principles, and Techniques
-
-
Pohl, K.1
Böckle, G.2
Van Der Linden, F.3
-
2
-
-
74549172117
-
Software product line testing: A systematic review
-
Shishkov, B., Cordeiro, J., Ranchordas, A. eds., INSTICC Press
-
Lamancha, B. M., Usaola, M. P., Velthius, M. P.: Software Product Line Testing: A Systematic Review. In: Shishkov, B., Cordeiro, J., Ranchordas, A. (eds.) Proceedings of the 4th International Conference on Software and Data Technologies (ICSOFT), vol. 1, pp. 23-30. INSTICC Press (2009)
-
(2009)
Proceedings of the 4th International Conference on Software and Data Technologies (ICSOFT)
, vol.1
, pp. 23-30
-
-
Lamancha, B.M.1
Usaola, M.P.2
Velthius, M.P.3
-
3
-
-
33751556525
-
Product family testing - A survey
-
Tevanlinna, A., Taina, J., Kauppinen, R.: Product Family Testing - a Survey. ACM SIG-SOFT Software Engineering Notes 29 (2) (2004)
-
(2004)
ACM SIG-SOFT Software Engineering Notes
, vol.29
, Issue.2
-
-
Tevanlinna, A.1
Taina, J.2
Kauppinen, R.3
-
4
-
-
33751575661
-
Software product line testing: Exploring principles and potential solutions
-
Pohl, K., Metzger, A.: Software Product Line Testing: Exploring Principles and Potential Solutions. Communications of the ACM 49 (12), 78-81 (2006)
-
(2006)
Communications of the ACM
, vol.49
, Issue.12
, pp. 78-81
-
-
Pohl, K.1
Metzger, A.2
-
5
-
-
84987194972
-
Data flow analysis techniques for test data selection
-
IEEE Computer Society, Los Alamitos, Catalog No. 82CH1795-4
-
Rapps, S., Weyuker, E. J.: Data Flow Analysis Techniques for Test Data Selection. In: Proceedings of 6th International Conference on Software Engineering (ICSE 1982), pp. 272-278. IEEE Computer Society, Los Alamitos (1982) Catalog No. 82CH1795-4
-
(1982)
Proceedings of 6th International Conference on Software Engineering (ICSE 1982)
, pp. 272-278
-
-
Rapps, S.1
Weyuker, E.J.2
-
6
-
-
77954476797
-
Use case-based testing of product lines
-
Paakki, J., Inverardi, P. eds., Poster Session, ACM Press, New York
-
Bertolino, A., Gnesi, S.: Use Case-Based Testing of Product Lines. In: Paakki, J., Inverardi, P. (eds.) Proceedings of the 9th European Software Engineering Conference held jointly with 11th ACM SIGSOFT International Symposium on Foundations of Software Engineering (ESEC/FSE), Poster Session, pp. 355-358. ACM Press, New York (2003)
-
(2003)
Proceedings of the 9th European Software Engineering Conference Held Jointly with 11th ACM SIGSOFT International Symposium on Foundations of Software Engineering (ESEC/FSE)
, pp. 355-358
-
-
Bertolino, A.1
Gnesi, S.2
-
7
-
-
15744391529
-
Testing a software product line
-
Software Engineering Institute, Product Line Systems Program. Carnegie Mellon University
-
McGregor, J. D.: Testing a Software Product Line. Software Engineering Institute, Technical Report, CMU/SEI-2001-TR-022, ESC-TR-2001-022, Product Line Systems Program. Carnegie Mellon University (2001)
-
(2001)
Technical Report, CMU/SEI-2001-TR-022, ESC-TR-2001-022
-
-
McGregor, J.D.1
-
8
-
-
35048841184
-
Towards generating acceptance tests for product lines
-
Bosch, J., Krueger, C. eds., Springer, Heidelberg
-
Geppert, B., Li, J., Roessler, F., Weiss, D. M.: Towards Generating Acceptance Tests for Product Lines. In: Bosch, J., Krueger, C. (eds.) ICOIN 2004 and ICSR 2004. LNCS, vol. 3107, pp. 35-48. Springer, Heidelberg (2004)
-
(2004)
ICOIN 2004 and ICSR 2004. LNCS
, vol.3107
, pp. 35-48
-
-
Geppert, B.1
Li, J.2
Roessler, F.3
Weiss, D.M.4
-
9
-
-
35048856032
-
A requirements based approach to test product families
-
van der Linden, F. J. ed., Springer, Heidelberg
-
Nebut, C., Fleurey, F., Le Traon, Y., Jézéquel, J.: A Requirements based Approach to Test Product Families. In: van der Linden, F. J. (ed.) PFE 2003. LNCS, vol. 3014, pp. 198-210. Springer, Heidelberg (2004)
-
(2004)
PFE 2003. LNCS
, vol.3014
, pp. 198-210
-
-
Nebut, C.1
Fleurey, F.2
Traon, Y.3
Jézéquel, J.4
-
10
-
-
78049378671
-
Reuse execution traces to reduce testing of product lines
-
Kindai Kagaku Sha Co. Ltd., Tokyo
-
Li, J. J., Geppert, B., Roessler, F., Weiss, D. M.: Reuse Execution Traces to Reduce Testing of Product Lines. In: SPLIT Workshop, Proceedings of the 11th International Product Line Conference (SPLC), Second Volume (Workshops), pp. 65-72. Kindai Kagaku Sha Co. Ltd., Tokyo (2007)
-
(2007)
SPLIT Workshop, Proceedings of the 11th International Product Line Conference (SPLC), Second Volume (Workshops)
, pp. 65-72
-
-
Li, J.J.1
Geppert, B.2
Roessler, F.3
Weiss, D.M.4
-
12
-
-
47949083738
-
Disambiguating the documentation of variability in software product lines: A separation of concerns, formalization and automated analysis
-
Sutcliffe, A., Jalote, P. eds., IEEE Computer Society, Los Alamitos
-
Metzger, A., Heymans, P., Pohl, K., Schobbens, P.-Y., Saval, G.: Disambiguating the Documentation of Variability in Software Product Lines: A Separation of Concerns, Formalization and Automated Analysis. In: Sutcliffe, A., Jalote, P. (eds.) Proceedings of the 15th IEEE Intl. Conference on Requirements Engineering (RE 2007), pp. 243-253. IEEE Computer Society, Los Alamitos (2007)
-
(2007)
Proceedings of the 15th IEEE Intl. Conference on Requirements Engineering (RE 2007)
, pp. 243-253
-
-
Metzger, A.1
Heymans, P.2
Pohl, K.3
Schobbens, P.-Y.4
Saval, G.5
-
14
-
-
33646205039
-
Determining the variation degree of feature models
-
Obbink, J. H., Pohl, K. eds., Springer, Heidelberg
-
Maßen, T.v. d., Lichter, H.: Determining the Variation Degree of Feature Models. In: Obbink, J. H., Pohl, K. (eds.) SPLC 2005. LNCS, vol. 3714, pp. 82-88. Springer, Heidelberg (2005)
-
(2005)
SPLC 2005. LNCS
, vol.3714
, pp. 82-88
-
-
Maßen, T.D.1
Lichter, H.2
|