Characterization of a membrane interface for analysis of air samples using time-of-flight mass spectrometry

Bulletin of the Korean Chemical Society

Volumn 31, Issue 10, 2010, Pages 2791-2796

  Jang, Yu Mi ^a   Oh, Jun Sik ^a   Park, Chang Joon ^b   Yang, Sang Sik ^c   Jung, Kwang Woo ^a  

^a Wonkwang University   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

^c Ajou University   (South Korea)

Author keywords

Diffusion coefficient; Membrane inlet; Polydimethylsiloxane (PDMS); Time of flight mass spectrometry

Indexed keywords

2-PROPANOL; AIR SAMPLES; ALKYL CHAIN LENGTHS; DETECTION LIMITS; DIFFUSION COEFFICIENTS; ENVIRONMENTAL MONITORING; FLIGHT MASS SPECTROMETRY; HALOGEN ATOMS; IN-SITU; ION SIGNALS; LINEAR DYNAMIC RANGES; MEMBRANE INTERFACE; NON-POLAR; POLYDIMETHYLSILOXANE MEMBRANE; POLYDIMETHYLSILOXANE PDMS; RESPONSE TIME; SAMPLE CONCENTRATION; SELECTIVE PERMEATION; STEP CHANGES; THREE ORDERS OF MAGNITUDE; TIME OF FLIGHT MASS SPECTROMETRY; TIME-DEPENDENT DIFFUSION;

AIR QUALITY; BENZENE; DIFFUSION; EQUATIONS OF STATE; ETHYLBENZENE; HALOGEN COMPOUNDS; MASS SPECTROMETERS; MEMBRANES; MICROCHANNELS; PERMEATION; SILICONES; VOLATILE ORGANIC COMPOUNDS;

MASS SPECTROMETRY;

EID: 78049374061     PISSN: 02532964     EISSN: 12295949     Source Type: Journal    
DOI: 10.5012/bkcs.2010.31.10.2791     Document Type: Article

References (40)

1. Mitra, S.; Kebbekus, B. Environmental Chemical Analysis; Chapman and Hall/CRC: Boca Raton, Florida, 1998.
2. Melita, L.; Popescu, M. J. Membr. Sci. 2008, 312, 157.
3. Hendren, Z. D.; Brant, J.; Wiesner, M. R. J. Membr. Sci. 2009, 331, 1.
4. Jnsson, J. A. 2003, 57, S/317.
5. Johnson, R. C.; Cooks, R. G.; Allen, T. M.; Cisper, M. E.; Hemberger, P. H. Mass Spectrom. Rev. 2000, 19, 1.
6. Ketola, R. A.; Kotiaho, T.; Cisper, M. E.; Allen, T. M. J. Mass Spectrom. 2002, 37, 457.
7. Viktorova, O. S.; Kogan, V. T.; Manninen, S. A.; Kotiaho, T.; Ketola, R. A.; Dubenskii, B. M.; Parinov, S. P.; Smirnov, O. V. J. Am. Soc. Mass Spectrom. 2004, 15, 823.
8. Janes, D. W.; Durning, C. J.; Van Pel, D. M.; Lynch, M. S.; Gill, C. G.; Krogh, E. T. J. Membr. Sci. 2008, 325, 81.
9. Schlueter, M.; Gentz, T. J. Am. Soc. Mass Spectrom. 2008, 19, 1395.
10. Frandsen, H.; Janfelt, C.; Lauritsen, F. R. Rapid Commun. Mass Spectrom. 2007, 21, 1574.
11. Oser, H.; Coggiola, M. J.; Young, S. E.; Crosley, D. R.; Hafer, V.; Grist, G. Chemosphere 2007, 67, 1701.
12. Mendes, M. A.; Eberlin, M. N. Analyst 2000, 125, 21.
13. Sysoev, A. A.; Ketola, R. A.; Mattila, I.; Tarkiainen, V.; Kotiaho, T. Int. J. Mass Spectrom. 2001, 212, 205.
14. Maden, A. J.; Hayward, M. J. Anal. Chem. 1996, 68, 1805.
15. Allen, T. M.; Falconer, T. M.; Cisper, M. E.; Borgerding, A. J.; Wilkerson, C. W., Jr. Anal. Chem. 2001, 73, 4830.
16. Moxom, J.; Reilly, P. T. A.; Whitten, W. B.; Ramsey, J. M. Anal. Chem. 2003, 75, 3739.
17. Yoon, T. O.; Choi, C. M.; Kim, H. J.; Kim, N. J. Bull. Korean Chem. Soc. 2007, 28, 619.
18. Sinha, M. P.; Tomassian, A. D. Rev. Sci. Instrum. 1991, 62, 2618.
19. Wiley, W. C.; McLaren, I. H. Rev. Sci. Instrum. 1955, 26, 1150.
20. White, A. J.; Blamire, M. G.; Corlett, C. A.; Griffiths, B. W.; Martin, D. M.; Spencer, S. B.; Mullock, S. J. Rev. Sci. Instrum. 1998, 69, 565.
21. Bae, Y. J.; Yoon, S. H.; Moon, J. H.; Kim, M. S. Bull. Korean Chem. Soc. 2010, 31, 92.
22. Song, K.; Cha, H.; Kim, D.; Min, K. Bull. Korean Chem. Soc. 2004, 25, 101.
23. Alexander, M. A.; Boscaini, E.; Lindinger, W.; Märk, T. D. Int. J. Mass Spectrom. 2003, 223-224, 763.
24. Hansen, K. F.; Gylling, S.; Lauritsen, F. R. Int. J. Mass Spectrom. 1996, 152, 143.
25. Miranda, L. D.; Short, R. T.; Van Amerom, F. H. W.; Bell, R. J.; Byrne, R. H. J. Membr. Sci. in press.
26. Dongré, A. R.; Hayward, M. J. Anal. Chim. Acta 1996, 327, 1.
27. Kim, T.-K.; Jung, K.-H.; Yoo, S.-K.; Jung, K.-W. Bull. Korean Chem. Soc. 2005, 26, 303.
28. Jung, K.-W.; Choi, S. S.; Jung, K.-H. Rev. Sci. Instrum. 1991, 62, 2125.
29. NIST Standard Reference Database 69; November 1998 Release: NIST Chemistry WebBook.
30. Watson, J. M.; Payne, P.A. J. Membr. Sci. 1990, 49, 171.
31. Tsai, G.-J.; Austin, G. D.; Syu, M. J.; Tsao, G. T.; Hayward, M. J.; Kotiaho, T.; Cooks, T. G. Anal. Chem. 1991, 63, 2460.
32. Pasternak, R. A.; Schimscheimer, J. F.; Heller, J. J. Polym. Sci. 1970, 8, 467.
33. Overney, F. L.; Enke, C. G. J. Am. Soc. Mass Spectrom. 1996, 7, 93.
34. Oh, K.-S.; Koo, Y.-M.; Jung, K.-W. Int. J. Mass Spectrom. 2006, 253, 65.
35. Ketola, R. A.; Ojala, M.; Sorsa, H.; Kotiaho, T.; Kostiainen, R. Anal. Chim. Acta 1997, 349, 359.
36. Sigma Aldrich Technical Information Bulletin: Mineral adsorbents, filter agents, and drying agents, http://www.sigmaaldrich.com/chemistry/aldrich- chemistry/tech-bulletins/al-143.html
37. Lauritsen, F. R.; Bohatka, S.; Degn, H. Rapid Commun. Mass Spectrom. 1990, 4, 401.
38. Lide, D. R. CRC Handbook of Chemistry and Physics, 81th ed.; CRC Press: London, 2000.
39. LaPack, M. A.; Tou, J. C.; Enke, C. G. Anal. Chem. 1990, 62, 1265.
40. Boscaini, E.; Alexander, M. L.; Prazeller, P.; Märk, T. D. Int. J. Mass Spectrom. 2004, 239, 179.