Relating halftone dot quality to paper surface topography

Communications in Computer and Information Science

Volumn 43 CCIS, Issue , 2009, Pages 178-189

  Kumpulainen, Pekka ^a   Mettänen, Marja ^a   Lauri, Mikko ^a   Ihalainen, Heimo ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

clustering; Print quality; SOM; surface topography; SVM classification

Indexed keywords

2D MEASUREMENT; BEFORE AND AFTER; CLUSTERING; DOT PATTERNS; DOT QUALITY; HALFTONE PRINTS; KEY ISSUES; PAPER SURFACE; PRINT QUALITIES; PRINTED DOTS; PRINTED MATERIALS; SC-PAPER; SOM; STATISTICAL DEPENDENCE; SUBPIXEL RESOLUTION; SUPPORT VECTOR MACHINE CLASSIFICATION; SVM CLASSIFICATION; TOPOGRAPHY MEASUREMENT;

DEFECTS; IMAGE QUALITY; PRINTING; PRINTING PRESSES; SELF ORGANIZING MAPS; SURFACES; TOPOGRAPHY; TWO DIMENSIONAL;

SURFACE TOPOGRAPHY;

CLASSIFICATION; DEFECTS; GRAVURE PRINTING; IMAGE QUALITY; PRINT QUALITY; PRINTING MACHINES; TOPOGRAPHY;

EID: 78049360505     PISSN: 18650929     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-3-642-03969-0_17     Document Type: Conference Paper

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