Error prediction robust tracking control system suppressing harmonics disturbance for optical disk recording system

Japanese Journal of Applied Physics

Volumn 49, Issue 8 PART 3, 2010, Pages

  Kamigaki, Yoshiya ^a   Ohishi, Kiyoshi ^a   Miyazaki, Toshimasa ^a,b   Koide, Daiichi ^a,c   Tokumaru, Haruki ^a,c   Takano, Yoshimichi ^a,c  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b NAGAOKA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^c NHK SCIENCE AND TECHNICAL RESEARCH LABORATORIES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL METHODS; DISK ROTATION; ERROR PREDICTION; HARMONIC DISTURBANCES; HARMONICS DISTURBANCE; HIGH-PRECISION; MEMORY CAPACITY; OPTICAL DISK RECORDING SYSTEM; ROBUST TRACKING CONTROL; ROBUST TRACKING CONTROLLER; TRACKING CONTROL SYSTEMS; TRACKING CONTROLS; TRACKING RESPONSE; ZERO-PHASE;

CONTROL THEORY; DISKS (STRUCTURAL COMPONENTS); HARMONIC ANALYSIS; NAVIGATION; OPTICAL DISK STORAGE; OPTICAL RECORDING; RECORDING INSTRUMENTS;

DATA STORAGE EQUIPMENT;

EID: 78049329857     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.08KC08     Document Type: Conference Paper

References (15)

1. D. Koide, Y. Takano, H. Tokumaru, N. Onagi, Y. Aman, S. Murata, Y. Sugimoto, and K. Ohishi: IEEE Trans. Magn. 45 (2009) 2190.
2. D. Koide, Y. Takano, H. Tokumaru, K. Ohishi, Y. Yoshiya, Y. Nabata, and T. Miyazaki: Proc. 35th IEEE IECON, 2009, p. 3120.
3. K. Ohishi, K. Kudo, K. Arai, and H. Tokumaru: Proc. IEEE. 6th Int. Workshop Advanced Motion Control, 2000, p. 92.
4. T. Katayama, M. Ogawa, and M. Nagasawa: IEEE Trans. Consum. Electron. 41 (1995) 313.
5. T. Yamaguchi, H. Numasato, and H. Hirai: IEEE/ASME Trans. Mechatronics 3 (1998) 202.
6. C. Smith and M. Tomizuka: Proc. 35th IEEE Conf. Decision and Control, 1996, p. 2503.
7. M. Tomizuka: J. Dyn. Syst. Meas. Control 109 (1987) 65.
8. K. Arai, H. Okumura, H. Tokumaru, and K. Ohishi: Jpn. J. Appl. Phys. 39 (2000) 855.
9. D. Koide, H. Yanagisawa, H. Tokumaru, K. Ohishi, and Y. Hayakawa: Jpn. J. Appl. Phys. 42 (2003) 939.
10. D. Koide, H. Yanagisawa, H. Tokumaru, S. Nakamura, K. Ohishi, K. Inomata, and T. Miyazaki: Jpn. J. Appl. Phys. 43 (2004) 4811.
11. D. Koide, H. Tokumaru, K. Ohishi, K. Kuramochi, and T. Miyazaki: Jpn. J. Appl. Phys. 45 (2006) 1187.
12. D. Koide, H. Tokumaru, K. Ohishi, T. Hayano, I. Shibutani, and T. Miyazaki: Jpn. J. Appl. Phys. 46 (2007) 3765.
13. D. Koide, Y. Takano, H. Tokumaru, N. Onagi, Y. Aman, S. Murata, Y. Sugimoto, and K. Ohishi: Jpn. J. Appl. Phys. 47 (2008) 5822.
14. K. Ohishi, T. Miyazaki, K. Inomata, H. Yanagisawa, D. Koide, and H. Tokumaru: IEEE Trans. Ind. Electron. 53 (2006) 838.
15. T. Miyazaki, K. Ohishi, I. Shibutani, D. Koide, and H. Tokumaru: Proc. IEEE ISIE, 2007, p. 3078.