Positive and negative exchange bias in IrMn/NiFe bilayers

Thin Solid Films

Volumn 519, Issue 3, 2010, Pages 1020-1024

  Anandakumar, S ^a   Rani, V Sudha ^a   Oh, Sunjong ^a   Kim, Cheolgi ^a  

^a Chungnam National University   (South Korea)

Author keywords

Double shifted hysteresis loops; IrMn NiFe bilayer; Positive and negative exchange bias

Indexed keywords

AFM; ANTIFERROMAGNETIC COUPLING; ANTIFERROMAGNETIC LAYERS; BI-LAYER; BI-LAYER STRUCTURE; CRYSTALLINE GROWTH; DC MAGNETRON SPUTTERING SYSTEMS; DOMAIN STRUCTURE; DOUBLE SHIFTED HYSTERESIS LOOPS; DOUBLE-SHIFTED LOOPS; EXCHANGE BIAS; EXCHANGE-BIAS FIELDS; FERROMAGNETIC COUPLING; FERROMAGNETIC LAYERS; HIGH VACUUM; LAYER THICKNESS; MAGNETIC FIELD ANNEALING; MAGNETIZATION DIRECTION; MAGNETIZATION REVERSAL PROCESS; MULTI DOMAINS; NEGATIVE FIELDS; POSITIVE AND NEGATIVE EXCHANGE BIAS; POSITIVE FIELDS;

ANTIFERROMAGNETIC MATERIALS; ATOMIC FORCE MICROSCOPY; DIFFRACTION; FERROMAGNETIC MATERIALS; FERROMAGNETISM; HOLOGRAPHIC INTERFEROMETRY; HYSTERESIS; IRIDIUM COMPOUNDS; LARGE SCALE SYSTEMS; MAGNETIC FIELDS; MAGNETIC FORCE MICROSCOPY; MAGNETIZATION REVERSAL; NEEL TEMPERATURE; X RAY DIFFRACTION;

HYSTERESIS LOOPS;

EID: 78049276301     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.08.035     Document Type: Conference Paper

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