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Volumn 12, Issue 10, 1996, Pages 873-879
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Assessment of local residual strain by electron backscatter patterns and nanoindentation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0004211864
PISSN: 02670836
EISSN: None
Source Type: Journal
DOI: 10.1179/mst.1996.12.10.873 Document Type: Article |
Times cited : (5)
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References (21)
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