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Volumn 9, Issue 4, 2010, Pages 359-371

Hazardous gases detection by fluctuation-enhanced gas sensing

Author keywords

enhanced gas sensing; Fluctuation measurements; gas sensors

Indexed keywords


EID: 77958524885     PISSN: 02194775     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219477510000277     Document Type: Article
Times cited : (40)

References (13)
  • 1
    • 36849125079 scopus 로고
    • Effect of electronic charge transfer between adsorbate and solid on chemisorption and catalysis
    • B. Weisz, Effect of electronic charge transfer between adsorbate and solid on chemisorption and catalysis, J. Chem. Phys. 21 (1953) 1531-1539.
    • (1953) J. Chem. Phys. , vol.21 , pp. 1531-1539
    • Weisz, B.1
  • 4
    • 0034322333 scopus 로고    scopus 로고
    • Extracting information from noise spectra of chemical sensors: Single sensor electronic noses and tongues
    • L. Kish, R. Vajtai and C. Granqvist, Extracting information from noise spectra of chemical sensors: Single sensor electronic noses and tongues, Sensor Actuator B 71 (2000) 55-59.
    • (2000) Sensor Actuator B , vol.71 , pp. 55-59
    • Kish, L.1    Vajtai, R.2    Granqvist, C.3
  • 5
    • 0242333279 scopus 로고    scopus 로고
    • Adsorption-desorption noise can be used for improving selectivity
    • A. K. Vidybida, Adsorption-desorption noise can be used for improving selectivity, Sensor Actuator A 107 (2003) 233-237.
    • (2003) Sensor Actuator A , vol.107 , pp. 233-237
    • Vidybida, A.K.1
  • 6
    • 44349103985 scopus 로고    scopus 로고
    • Low-frequency noise in structures with porous silicon in different gas media
    • Z. H. Mkhitaryan, A. A. Shatveryan, V. M. Aroutiounian et al., Low-frequency noise in structures with porous silicon in different gas media, Physica Status Solidi 4 (2007) 2063-2067.
    • (2007) Physica Status Solidi , vol.4 , pp. 2063-2067
    • Mkhitaryan, Z.H.1    Shatveryan, A.A.2    Aroutiounian, V.M.3
  • 9
    • 34748831990 scopus 로고
    • eds. H. Gallaire and J. Winker (Plenum Press, New York
    • K. L. Clark, Flicker Noise Data Base, eds. H. Gallaire and J. Winker (Plenum Press, New York, 1973), pp. 293-306.
    • (1973) Flicker Noise Data Base , pp. 293-306
    • Clark, K.L.1
  • 10
    • 77958599705 scopus 로고
    • Total elimination of 1/f noise from conventional MOS transistors
    • M. Joliat, Total elimination of 1/f noise from conventional MOS transistors, IEEE Trans. Electr. Dev. 45 (1976) 753-764.
    • (1976) IEEE Trans. Electr. Dev. , vol.45 , pp. 753-764
    • Joliat, M.1
  • 12
    • 24544459259 scopus 로고
    • 1/f noise is no surface effect
    • F. N. Hooge, 1/f noise is no surface effect, Phys. Lett. A 29 (1969) 139-140.
    • (1969) Phys. Lett. A , vol.29 , pp. 139-140
    • Hooge, F.N.1
  • 13
    • 0029309742 scopus 로고
    • Quality and 1/f noise of electronic components
    • A. Konczakowska, Quality and 1/f noise of electronic components, Qual. Reliab. Eng. Int. 13 (1995) 165-169.
    • (1995) Qual. Reliab. Eng. Int. , vol.13 , pp. 165-169
    • Konczakowska, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.