Modeling high rate impact sensitivity of perfect RDX and HMX crystals by ReaxFF reactive dynamics

Journal of Energetic Materials

Volumn 28, Issue SUPPL. 1, 2010, Pages 92-127

  Zhang, Luzheng ^a   Zybin, Sergey V ^b   van Duin, Adri C T ^c   Goddard III, William A ^b  

^a NEW MEXICO INSTITUTE OF MINING AND TECHNOLOGY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c The Pennsylvania State University   (United States)

Author keywords

Computer molecular dynamics; HMX; RDX; Sensitivity; Shock

Indexed keywords

EID: 77958519823     PISSN: 07370652     EISSN: 15458822     Source Type: Journal    
DOI: 10.1080/07370652.2010.504682     Document Type: Article

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