A new analytical method for stress intensity factors based on in situ measurement of crack deformation under biaxial tension

Materials and Design

Volumn 32, Issue 2, 2011, Pages 664-670

  Wang, J G ^a   Ju, D Y ^a,b   Sun, M J ^b   Li, S L ^b  

^a SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY LIAONING   (China)

Author keywords

Biaxial tension; In situ observation; Stress intensity factor

Indexed keywords

ANALYTICAL METHOD; ASYMPTOTIC EXPANSION; BIAXIAL STRESS; BIAXIAL TENSIONS; COUPLED EFFECT; CRACK DEFORMATION; CRACK TIP DISPLACEMENT; DUGDALE MODEL; EXPERIMENTAL DATA; FULL-FIELD; IN-SITU MEASUREMENT; IN-SITU OBSERVATIONS; ISOTROPIC AND ORTHOTROPIC MATERIAL; LOADING PROCESS; NEW APPROACHES; OPTICAL MICROSCOPES; ORTHOTROPIC PROPERTIES; STRESS INTENSITY; SURFACE RESIDUAL STRESS; X-RAY DIFFRACTION MEASUREMENTS;

ASPHALT PAVEMENTS; ASYMPTOTIC ANALYSIS; CRACK TIPS; DEFORMATION; PAPER SHEETING; SILICON STEEL; STEEL SHEET; STRESS ANALYSIS; X RAY DIFFRACTION;

STRESS INTENSITY FACTORS;

EID: 77958480779     PISSN: 02641275     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matdes.2010.08.005     Document Type: Article

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