Characterization of LixMg0.2Zn0.8-xO quaternary alloy thin films prepared by sol-gel

Gongneng Cailiao/Journal of Functional Materials

Volumn 41, Issue 9, 2010, Pages 1623-1626

  Liu, Feng Qiong ^a   Liu, Su ^a   Suo, Ya Qin ^a   Yin, Xiao Li ^a   Chang, Peng ^a   Wen, Yan ^a  

^a LANZHOU UNIVERSITY   (China)

Author keywords

Conductivity; Crystalline; LixMg0.2Zn0.8 xO quaternary alloy thin films; Photoluminescence

Indexed keywords

CONDUCTIVITY; CRYSTALLINE; GRAIN SIZE; PHOTOLUMINESCENCE INTENSITIES; PHOTOLUMINESCENCE SPECTRUM; QUATERNARY ALLOYS; SEM; SOL-GEL METHODS; STRUCTURAL CHARACTERISTICS; THERMAL PROBE; VAN DER PAUW METHOD; VISIBLE LIGHT; ZNO; ZNO THIN FILM;

ALLOYS; CRYSTALLINE MATERIALS; GELS; METALLIC FILMS; OPTICAL FILMS; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; ZINC; ZINC ALLOYS; ZINC OXIDE;

FILM PREPARATION;

EID: 77958149608     PISSN: 10019731     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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