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Volumn 35, Issue 2, 2011, Pages 223-235

Fast identification of cracks using higher-order topological sensitivity for 2-D potential problems

Author keywords

Crack identification; Topological sensitivity

Indexed keywords

TOPOLOGY;

EID: 77958090329     PISSN: 09557997     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.enganabound.2010.08.007     Document Type: Article
Times cited : (40)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.