From imaging to material identification: A generalized concept of topological sensitivity

Journal of the Mechanics and Physics of Solids

Volumn 55, Issue 2, 2007, Pages 245-279

  Guzina, Bojan B ^a   Chikichev, Ivan ^a  

^a University of Minnesota   (United States)

Author keywords

Elastic waves; Imaging; Inverse scattering; Topological sensitivity; Transmission problem

Indexed keywords

ASYMPTOTIC STABILITY; ELASTIC WAVES; ELASTOHYDRODYNAMICS; FAILURE ANALYSIS; GREEN'S FUNCTION; IMAGING TECHNIQUES; NUCLEATION; NUMERICAL ANALYSIS; TOPOLOGY;

ELASTIC INCLUSION; INVERSE SCATTERING; MATERIAL DEFECTS; STRESS WAVES; TOPOLOGICAL SENSITIVITY; ULTRASOUND WAVES;

MATERIALS SCIENCE;

EID: 33845230843     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmps.2006.07.009     Document Type: Article

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