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Volumn , Issue , 2001, Pages 644-647

Theoretical study of inception mechanism and growth of defect-induced damages in XLPE cable

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; IONIZATION OF GASES; THERMAL EFFECTS;

EID: 0035179849     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (18)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.