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Volumn , Issue , 2001, Pages 644-647
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Theoretical study of inception mechanism and growth of defect-induced damages in XLPE cable
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC BREAKDOWN;
ELECTRIC FIELD EFFECTS;
IONIZATION OF GASES;
THERMAL EFFECTS;
ELECTRIC STRESSES;
ELECTRIC CABLES;
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EID: 0035179849
PISSN: 00849162
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (18)
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References (12)
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