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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7784, Issue , 2010, Pages

Rutherford backscattering and optical studies for ZnO thin films on sapphire substrates grown by metalorganic chemical vapor deposition

(8) Chung, Yee Ling a Li, Lin b Yao, Shude b Feng, Zhe Chuan a Fenwick, William E c Zaidi, Tahir c Ferguson, Ian T d Lu, Weijie e

a NATIONAL TAIWAN UNIVERSITY (Taiwan)

b PEKING UNIVERSITY (China)

c GEORGIA INSTITUTE OF TECHNOLOGY (United States)

d University of North Carolina at Charlotte (United States)

e FISK UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE-SCANNING; CHARACTERIZATION TECHNIQUES; METALORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL STUDY; OPTICAL TRANSMISSIONS; ROUGHNESS LAYERS; RUTHERFORD BACK-SCATTERING; SAPPHIRE SUBSTRATES; SEM; STRUCTURE CHARACTERIZATION; ZNO; ZNO THIN FILM;

ATOMIC FORCE MICROSCOPY; BACKSCATTERING; DEPOSITION; LIGHT TRANSMISSION; LIGHTING; METALLIC FILMS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL FILMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ZINC OXIDE;

OPTICAL PROPERTIES;

EID: 77958021223 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.859109 Document Type: Conference Paper

Times cited : (2)

References (10)

1
- 70449730669
- Janotti A., G Van de Walle C., Rep. Prog. Phys. 72, 126501 (2009).
- (2009) Rep. Prog. Phys. , vol.72 , pp. 126501
- Janotti, A.¹ Van De Walle, C.G.²

2
- 0029293262
- Mang A, Reimann K., and R̈ubenacke St, Solid State Commun, . 94, 251, (1995).
- (1995) Solid State Commun , vol.94 , pp. 251
- Mang, A.¹ Reimann, K.² R̈ubenacke, St.³

3
- 0001698725
- Reynolds D. C., Look D. C., Jogai B., Litton C. W., Cantwell G. and Harsch W. C., Phys. Rev. B, 60, 2340, (1999).
- (1999) Phys. Rev. B , vol.60 , pp. 2340
- Reynolds, D.C.¹ Look, D.C.² Jogai, B.³ Litton, C.W.⁴ Cantwell, G.⁵ Harsch, W.C.⁶

4
- 0000288835
- Chen Y., Bagnall D. M., Koh H-J, Park K-T, Hiraga K., Zhu Z-Q and Yao T., J. Appl. Phys. 84 3912, (1998).
- (1998) J. Appl. Phys. , vol.84 , pp. 3912
- Chen, Y.¹ Bagnall, D.M.² Koh, H.-J.³ Park, K.-T.⁴ Hiraga, K.⁵ Zhu, Z.-Q.⁶ Yao, T.⁷

5
- 0001106216
- Srikant V., Clarke D. R., J. Appl. Phys., 83, 5447, (1998).
- (1998) J. Appl. Phys. , vol.83 , pp. 5447
- Srikant, V.¹ Clarke, D.R.²

6
- 34247360842
- Lo K.Y., Huang Y.J., Huang J.Y., Feng Z.C., Fenwick W.E., Pan M., Ferguson I.T., Appl. Phys. Lett., 90, 161904 (2007).
- (2007) Appl. Phys. Lett. , vol.90 , pp. 161904
- Lo, K.Y.¹ Huang, Y.J.² Huang, J.Y.³ Feng, Z.C.⁴ Fenwick, W.E.⁵ Pan, M.⁶ Ferguson, I.T.⁷

7
- 77958020321
- Sun S., Tompa G.S., Rice C., Sun X.W., Lee Z.S., Lien S.C., Huang C.W., Cheng L.C., Feng Z.C., Thin Solid Films, 516, 5572-5277 (2008).
- (2008) Thin Solid Films , vol.516 , pp. 5277-5572
- Sun, S.¹ Tompa, G.S.² Rice, C.³ Sun, X.W.⁴ Lee, Z.S.⁵ Lien, S.C.⁶ Huang, C.W.⁷ Cheng, L.C.⁸ Feng, Z.C.⁹

8
- 0011466601
- Takata S., Minami T., and Nanto H., Jpn. J. Appl. Phys., 20, 1759 (1981).
- (1981) Jpn. J. Appl. Phys. , vol.20 , pp. 1759
- Takata, S.¹ Minami, T.² Nanto, H.³

9
- 0029288229
- Tanaka S., Takahashi K., Sekiguchi T., Sumino K., and Tanaka J., J. Appl. Phys., 77, 4021 (1995).
- (1995) J. Appl. Phys. , vol.77 , pp. 4021
- Tanaka, S.¹ Takahashi, K.² Sekiguchi, T.³ Sumino, K.⁴ Tanaka, J.⁵

10
- 0031102020
- Sekiguchi T., Ohashi N., and Terada Y., Jpn. J. Appl. Phys., Part 2 36, L289 (1997).
- (1997) Jpn. J. Appl. Phys. , vol.36 , Issue.PART 2
- Sekiguchi, T.¹ Ohashi, N.² Terada, Y.³

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