Micropillar compression of Al/SiC nanolaminates

Acta Materialia

Volumn 58, Issue 20, 2010, Pages 6628-6636

  Singh, D R P ^a   Chawla, N ^a   Tang, G ^b   Shen, Y L ^b  

^a Arizona State University   (United States)

^b MSC01 1070   (United States)

Author keywords

Focused ion beam; Micropillar compression; Nanoindentation; Nanolaminate

Indexed keywords

DEFORMATION FEATURE; EXPERIMENTAL OBSERVATION; FINITE ELEMENT MODELING; FOCUSED ION BEAM MILLING; FRACTOGRAPHIC ANALYSIS; LENGTH SCALE; MECHANICAL PROPERTIES OF MATERIALS; MECHANICAL STRENGTH; MICRO PILLARS; MULTI-LAYERED; NANO-LAMINATES; NANOINDENTERS; NANOLAMINATE; PILLAR STRUCTURE; SOFT LAYERS; STRESS STATE; YOUNG'S MODULUS;

BEAM PLASMA INTERACTIONS; COMPRESSION TESTING; FOCUSED ION BEAMS; ION BOMBARDMENT; IONS; MATERIALS PROPERTIES; MODELS; NANOINDENTATION; SILICON CARBIDE; STRESSES;

MECHANICAL PROPERTIES;

EID: 77958008638     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.08.025     Document Type: Article

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