Ferromagnetism in ZnTe:Cr film grown on Si(1 0 0)

Journal of Alloys and Compounds

Volumn 509, Issue 1, 2011, Pages 80-86

  Soundararajan, D ^a,e   Peranantham, P ^a,b   Mangalaraj, D ^a   Nataraj, D ^a   Dorosinskii, L ^c   Santoyo Salazar, J ^d   Ko, J M ^e  

^a BHARATHIAR UNIVERSITY   (India)

^b Nancy University   (France)

^c NATIONAL METROLOGY INSTITUTE   (Turkey)

^d DEPARTAMENTO DE FÍSICA   (Mexico)

^e Hanbat National University   (South Korea)

Author keywords

M H curve; M T measurements; Magnetic domains; ZnTe:Cr film

Indexed keywords

AMBIENT TEMPERATURES; ANISOTROPIC DOMAINS; ANTIFERROMAGNETICS; AVERAGE SIZE; COERCIVE FIELD; COMPOSITION ANALYSIS; CR FILM; CRYSTALLINITIES; M-H CURVE; M-T MEASUREMENTS; MAGNETIC FIELD DEPENDENCES; MOMENT MEASUREMENTS; SHORT-RANGE FERROMAGNETIC ORDER; SI(1 0 0); TEMPERATURE DEPENDENCE; THERMAL EVAPORATION METHOD; XPS;

AMORPHOUS FILMS; ANTIFERROMAGNETISM; CHROMIUM; FERROMAGNETISM; HYSTERESIS; MAGNETIC FIELDS; MAGNETIC FORCE MICROSCOPY; MAGNETIC MATERIALS; MAGNETIC MOMENTS; TELLURIUM COMPOUNDS; THERMAL EVAPORATION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

MAGNETIC DOMAINS;

EID: 77957989318     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.08.103     Document Type: Article

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