Hybrid polymer-silicon proton conducting membranes via a pore-filling surface-initiated polymerization approach

ACS Applied Materials and Interfaces

Volumn 2, Issue 1, 2010, Pages 279-287

  Yameen, Basit ^a   Kaltbeitzel, Anke ^a   Glasser, Gunnar ^a   Langner, Andreas ^b   Müller, Frank ^b   Gösele, Ulrich ^b   Knoll, Wolfgang ^c   Azzaroni, Omar ^d  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c AIT AUSTRIAN INSTITUTE OF TECHNOLOGY   (Austria)

^d INSTITUTO DE INVESTIGACIONES FISICOQUÍMICAS TEÓRICAS Y APLICADAS INIFTA   (Argentina)

Author keywords

Fuel cells; Materials science; Nanotechnology; Polymer brushes; Proton transport; Thin films

Indexed keywords

ACRYLAMIDES; ALTERNATIVE APPROACH; HIGH DIMENSIONAL STABILITY; HYBRID ASSEMBLY; HYBRID MEMBRANE; HYBRID POLYMERS; IMPEDANCE SPECTROSCOPY; MACRO POROUS SILICON; MICRO-DOMAINS; MICROPORES; MICROSTRUCTURED SCAFFOLD; MOLECULAR DESIGN; MORPHOLOGICAL ASPECTS; POLYMER BRUSHES; PORE FILLING; POROUS MATRIXS; PROTON CONDUCTING; PROTON CONDUCTING MEMBRANES; PROTON TRANSPORT; SURFACE INITIATED POLYMERIZATION; SURFACE-INITIATED ATOM TRANSFER;

AMIDES; ATOM TRANSFER RADICAL POLYMERIZATION; BRUSHES; BUTANE; CHEMICAL STABILITY; COMPOSITE MEMBRANES; CRYSTAL ATOMIC STRUCTURE; DIMENSIONAL STABILITY; ELECTRON TRANSITIONS; FILLING; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FREE RADICAL REACTIONS; FUEL CELLS; HYDROGELS; NANOTECHNOLOGY; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; POLYELECTROLYTES; POLYMER FILMS; POLYMERIZATION; POROUS SILICON; RESONANCE; SCANNING ELECTRON MICROSCOPY; SODIUM; SURFACES; SYSTEM STABILITY; THIN FILMS; TWO DIMENSIONAL; X RAY PHOTOELECTRON SPECTROSCOPY;

PROTONS;

2 ACRYLAMIDO 2 METHYLPROPANESULFONATE; 2-ACRYLAMIDO-2-METHYLPROPANESULFONATE; ACRYLAMIDE DERIVATIVE; ALKANESULFONIC ACID; POLYMER; SILICON;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; POROSITY;

ACRYLAMIDES; ALKANESULFONATES; MEMBRANES, ARTIFICIAL; POLYMERS; POROSITY; SILICON;

EID: 77957942592     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am900690x     Document Type: Article

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