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Volumn 623, Issue 2, 2010, Pages 791-793
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Fourier-transform far-infrared spectroscopic ellipsometry for standoff material identification
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Author keywords
Ellipsometry; Explosives; Infrared spectroscopy; Synchrotron radiation; Terahertz range
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Indexed keywords
ABSOLUTE REFLECTANCE;
CALIBRATION PROCEDURE;
COMPLEX DIELECTRIC CONSTANT;
EFFICIENT METHOD;
ELLIPSOMETRIC ANALYSIS;
EXPLOSIVE MATERIALS;
FAR-INFRARED;
FOURIER TRANSFORM SPECTROMETERS;
FREQUENCY RANGES;
GRATING SPECTROMETERS;
KRAMERS-KRONIG;
MATERIAL IDENTIFICATION;
NEAR-INFRARED RANGE;
POLARIZED LIGHT;
ROUTINE METHOD;
SECURITY APPLICATION;
SPECIFIC ABSORPTION;
SPECTROSCOPIC IDENTIFICATION;
SURFACES AND INTERFACES;
TERA HERTZ;
TERAHERTZ RANGE;
UV- AND;
ABSORPTION SPECTROSCOPY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
FOURIER TRANSFORMS;
LIGHT REFLECTION;
NITRATION;
OPTICAL CONSTANTS;
OPTICAL PROPERTIES;
SPECTROMETRY;
SPECTROSCOPIC ELLIPSOMETRY;
SYNCHROTRON RADIATION;
SYNCHROTRONS;
TERAHERTZ SPECTROSCOPY;
TERAHERTZ WAVES;
SPECTROMETERS;
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EID: 77957936002
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2010.02.079 Document Type: Article |
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Times cited : (4)
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References (6)
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