Electron diffraction with bound electrons: The structure sensitivity of Rydberg Fingerprint Spectroscopy

Journal of Molecular Structure

Volumn 978, Issue 1-3, 2010, Pages 250-256

  Liang, Xiao ^a   Levy, Michael G ^a   Deb, Sanghamitra ^a   Geiser, Joseph D ^b   Stratt, Richard M ^a   Weber, Peter M ^a  

^a BROWN UNIVERSITY   (United States)

^b Ryon Technologies Inc   (United States)

Author keywords

Electron diffraction; Molecular ion core model; Numerical grid method; Perturbation theory; Rydberg states; Structure sensitivity

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON ENERGY LEVELS; ELECTRONS; ION SOURCES; IONS; MOLECULAR STRUCTURE; NUMERICAL METHODS; PHASE SHIFT; RYDBERG STATES; PHASE SHIFTERS;

INTERNAL ENERGIES; MOLECULAR IONS; MOLECULAR PARAMETERS; NUMERICAL GRIDS; PERTURBATION THEORY; RYDBERG FINGERPRINT SPECTROSCOPY; STRUCTURE SENSITIVITY; TRANSIENT STRUCTURE;

PERTURBATION TECHNIQUES;

EID: 77957906348     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molstruc.2010.02.041     Document Type: Article

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