III-V: Replacing Si or more than moore?

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2010, Pages 149-150

  Sun, Yanning ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL MATERIALS; FREQUENCY-SCALING; III-V COMPOUND SEMICONDUCTOR; LOWER POWER DEVICES; THERMAL LIMITS;

SEMICONDUCTOR DEVICES;

EID: 77957879174     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2010.5556206     Document Type: Conference Paper

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