Filters and calibration sources for the Soft X-ray Spectrometer (SXS) instrument on ASTRO-H

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7732, Issue , 2010, Pages

  De Vries, C P ^a   Den Herder, J W ^a   Costantini, E ^a   Aarts, H ^a   Lowes, P ^a   Kaastra, J S ^a   Kelley, R ^b   Gendreau, K ^b   Arzoumanian, Z ^b   Koenecke, R ^b   Haas, D ^c   Paltani, S ^c   Mitsuda, K ^d   Yamasaki, N Y ^d  

^a SRON NETHERLANDS INSTITUTE FOR SPACE RESEARCH   (Netherlands)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c UNIVERSITY OF GENEVA   (Switzerland)

^d JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

Calibration source; Filter; X ray

Indexed keywords

CALIBRATION SOURCE; CONTAMINATION MONITORING; FILTER; GAIN CALIBRATION; HIGH SPECTRAL RESOLUTION; MICROCALORIMETER; OPTICAL BLOCKING FILTERS; RAY CALIBRATION; SOFT X-RAY; SWITCHABLE; TRADE OFF; X-RAY OBSERVATIONS;

ABSORPTION; CALIBRATION; INSTRUMENTS; OPTICAL TELESCOPES; SPACE TELESCOPES; SPECTROMETRY; X RAY ABSORPTION; X RAY SPECTROMETERS; X RAYS;

GAMMA RAYS;

EID: 77957868400     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.855880     Document Type: Conference Paper

References (4)

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