Measurement of optical constants n and k of Lexan and polyimide

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3765, Issue , 1999, Pages 805-815

  Cavadi, A ^a   Artale, M A ^a   Barbera, M ^a   Collura, A ^a   Powell, F R ^a   Varisco, S ^a  

^a INAF OSSERVATORIO ASTRONOMICO DI PALERMO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; MULTILAYERS; OPTICAL FILTERS; OPTICAL PROPERTIES; PARAMETER ESTIMATION; POLYIMIDES; RADIATION DETECTORS; REFRACTIVE INDEX; THIN FILMS; X RAYS;

KRAMERS-KRONIG RELATIONSHIP; LEXAN; OPTICAL CONSTANT; X RAY DETECTOR;

OPTICAL VARIABLES MEASUREMENT;

EID: 0033334407     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)