Edge detection with sub-pixel accuracy in images of molten metals

2010 IEEE International Conference on Imaging Systems and Techniques, IST 2010 - Proceedings

Volumn , Issue , 2010, Pages 186-191

  Fabijańska, Anna ^a   Sankowski, Dominik ^a  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Edge detection; Gradient; Heat emitting objects; Metals and alloys; Scharr; Sobel; Sub pixel accuracy; Surface property

Indexed keywords

GRADIENT; HEAT-EMITTING OBJECTS; METALS AND ALLOYS; SCHARR; SOBEL; SUBPIXEL ACCURACY;

ALLOYS; EDGE DETECTION; IMAGING SYSTEMS; LIQUID METALS; METALS; PIXELS; SURFACE PROPERTIES; TEMPERATURE MEASUREMENT;

METALLURGY;

EID: 77957832369     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IST.2010.5548462     Document Type: Conference Paper

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