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Volumn , Issue , 2010, Pages 1278-1283

Induction defectoscope based on uniform eddy current probe with GMRs

Author keywords

Digital signal processor; Magnetoresistances sensors; Non destructive testing; Uniform eddy current probe

Indexed keywords

ALUMINUM PLATES; BEST RESPONSE; CONDUCTIVE PLATES; CRACK ORIENTATIONS; DEFECT DETECTION; DETECTION OF DEFECTS; EDDY CURRENT PROBES; EXCITATION COILS; EXCITATION CURRENTS; FITTING ALGORITHMS; LABVIEW; NON DESTRUCTIVE TESTING; PHASE EXTRACTION; PROCESSING UNITS; SINUSOIDAL SIGNALS; UNIFORM EDDY CURRENT PROBE;

EID: 77957832064     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2010.5488189     Document Type: Conference Paper
Times cited : (9)

References (13)
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  • 3
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  • 5
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  • 8
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  • 9
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  • 11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.