Inductive probe for flaw detection in non-magnetic metallic plates using eddy currents

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2008, Pages 1447-1451

  Ribeiro, A Lopes ^a   Ramos, H Geirinhas ^a  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

Author keywords

Eddy currents; Electromagnetic non destructive evaluation; Inductive sensors

Indexed keywords

COMPUTER NETWORKS; INSTRUMENTS;

ELECTROMAGNETIC NON-DESTRUCTIVE EVALUATION; INDUCTIVE SENSORS; MEASUREMENT TECHNOLOGIES;

EDDY CURRENTS;

EID: 51349169572     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2008.4547270     Document Type: Conference Paper

References (8)

1. T. Sollier, D. Prémel, D. Lesselier, editors, Electromagnetic Nondestructive Evaluation (VIII), Studies in Applied Electromagnetics and Mechanics 24, IOS Press, 2004.
2. R. Grimberg et al, "2D Eddy current sensor array", NDT & E International ,vol. 39, pp. 264-271, 2006.
3. S. Quek et al., "Three dimensional image rendering of steel reinforcing bars using curvilinear models applied to orthogonal line scans taken by an inductive sensor", NDT & E International ,vol. 36, pp. 7-18, 2003.
4. P.-Y. Joubert, Y. Le Bihan, "Multi sensor probe and defect classification in eddy current tubing inspection", Sensors and Actuators A, vol. 129, pp. 10-14, (2006).
5. K. Kuczmann, A. Iványi, "Nonlinear simulation of a nondestructive testing measurement system", Physica B, vol. 372, pp. 373-377, 2006.
6. P. Gaydecki, I. Silva, B. T. Fernandes, Z. Z. Yu, "A portable inductive scanning system for image steel-reinforcing bars embedded within concrete", Sensors and Actuators, vol. 84, pp. 25-32, 2000.
7. G. Miller et al., "A combined Q and heterodyne sensor incorporating real-time DSP for reinforcement imaging, corrosion detection and material characterization", Sensors and Actuators A, vol. 121, pp. 339-346, 2005.
8. Z. T. Bilau, J. Markus, SFIT4 IEEE-STD-1241, Standard four parameter fit of a sine wave to measured data.IEEE Reference