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Volumn 7773, Issue , 2010, Pages

Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules

Author keywords

FEM; Reliability; Ribbon; Thermal cycling test; Thermo mechanical

Indexed keywords

A-THERMAL; DIGITAL IMAGE CORRELATIONS; FATIGUE BEHAVIOR; FEM; FINITE ELEMENT ANALYSIS; INDIVIDUAL CELLS; INTERCONNECTORS; LAYOUT OPTIMIZATION; MEASURING CELLS; PHOTOVOLTAIC MODULES; RIBBON; SOLAR MODULE; THERMAL CYCLING TEST; THERMO-MECHANICAL; THERMO-MECHANICAL STRESS;

EID: 77957826117     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.861350     Document Type: Conference Paper
Times cited : (4)

References (4)
  • 1
    • 78650106658 scopus 로고    scopus 로고
    • Reliability of copper-ribbons in photovoltaic modules under thermo-mechanical loading
    • June 20-25, Honolulu, USA
    • th IEEE PVSC, June 20-25, 2010, Honolulu, USA
    • (2010) th IEEE PVSC
    • Meier, R.1
  • 2
    • 77957853087 scopus 로고    scopus 로고
    • Constitutive behaviour of copper-ribbons used in solar cell assembly processes
    • April 28-30, Delft, The Netherlands
    • Wiese, S. et al, "Constitutive Behaviour of Copper-Ribbons used in Solar Cell Assembly Processes", Proc. EuroSimE 2009, April 28-30, 2009, Delft, The Netherlands, pp.44-51
    • (2009) Proc. EuroSimE 2009 , pp. 44-51
    • Wiese, S.1
  • 3
    • 77957850495 scopus 로고    scopus 로고
    • Thermo-mechanical behaviour of copper ribbon materials
    • Sept. 21-25, Hamburg, Germany
    • Meier, R. et al, "Thermo-mechanical Behaviour of Copper Ribbon Materials", Proc. 24th EU PVSEC 2009, Sept. 21-25, 2009, Hamburg, Germany, pp. 3413-3419
    • (2009) Proc. 24th EU PVSEC 2009 , pp. 3413-3419
    • Meier, R.1
  • 4
    • 77957836255 scopus 로고    scopus 로고
    • Interconnection Technologies for Photovoltaic Modules - Analysis of technological and mechanical Problems
    • April 26-28, Bordeaux, France
    • Wiese, S. et al, "Interconnection Technologies for Photovoltaic Modules - Analysis of technological and mechanical Problems" Proc. EuroSimE 2010, April 26-28, 2010, Bordeaux, France, pp. 345-350
    • (2010) Proc. EuroSimE 2010 , pp. 345-350
    • Wiese, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.