Projection of excited orbitals into kinetic energies of emitted electrons in resonant Si KLL Auger decays of SiF4

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 82, Issue 4, 2010, Pages

  Suzuki, I H ^a   Kono, Y ^b   Ikeda, A ^b   Ouchi, T ^c   Ueda, K ^c   Takahashi, O ^d   Higuchi, I ^e   Tamenori, Y ^e   Nagaoka, S ^b  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b EHIME UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d HIROSHIMA UNIVERSITY   (Japan)

^e JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER DECAYS; ELECTRON EXCITATIONS; EMITTED ELECTRON; EXCITED ELECTRONS; ORBITALS; RESONANT AUGER; RESONANT AUGER DECAY; RYDBERG ELECTRON; RYDBERG ORBITALS; SPECTROSCOPIC TECHNIQUE; TOTAL ION YIELDS; UNDULATOR RADIATION; VALENCE ORBITALS;

AUGERS; MOLECULAR ORBITALS; PHOTOEXCITATION; SEMICONDUCTING SILICON COMPOUNDS;

ELECTRONS;

EID: 77957810585     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.82.045401     Document Type: Article

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