Generalized Likelihood Ratio Rest for voltage dip detection

2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings

Volumn , Issue , 2010, Pages 476-481

  Moschitta, Antonio ^a   Carbone, Paolo ^a   Muscas, Carlo ^b  

^a UNIVERSITY OF PERUGIA   (Italy)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

Detection; Generalized Likelihood Ratio Test; IEC 61000 4 30; Power quality; Voltage dips

Indexed keywords

CLASSICAL APPROACH; DETECTION; DETECTION ALGORITHM; GENERALIZED LIKELIHOOD RATIO; GENERALIZED LIKELIHOOD RATIO TEST; GENERALIZED LIKELIHOOD-RATIO TESTS; IEC 61000-4-30; POWER SYSTEMS; ROOT MEAN SQUARE; VOLTAGE DIP;

INSTRUMENTS; MEASUREMENT THEORY;

COMPUTER SIMULATION;

EID: 77957606344     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2010.5488097     Document Type: Conference Paper

References (11)

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