Statistical properties of voltage dip detectors

2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement, AMUEM 2009

Volumn , Issue , 2009, Pages 69-73

  Guerrieri, G ^a   Moschitta, A ^a   Carbone, P ^a   Muscas, C ^b  

^a UNIVERSITY OF PERUGIA   (Italy)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

Generalized likelihood ratio test; IEC 61000 4 30; Power quality; Root mean square; Voltage dips

Indexed keywords

DETECTION ALGORITHM; GENERALIZED LIKELIHOOD RATIO TEST; GENERALIZED LIKELIHOOD-RATIO TESTS; IEC 61000-4-30; RECEIVER OPERATING CHARACTERISTICS; ROOT MEAN SQUARES; ROOT-MEAN-SQUARE; STANDARDIZED PROCEDURE; STATISTICAL PROPERTIES; THEORETICAL MODELING; VOLTAGE DIP; VOLTAGE DIPS;

ELECTRIC MEASURING INSTRUMENTS; ELECTRIC POWER SYSTEMS; ELECTRIC PROPERTIES; MAXIMUM LIKELIHOOD ESTIMATION; UNCERTAINTY ANALYSIS;

STATISTICAL TESTS;

EID: 70449434885     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AMUEM.2009.5207598     Document Type: Conference Paper

References (11)

1. M. H. J. Bollen, "Voltage sags: effects, mitigation, and prediction," IEEE Power Engineering Journal, Vol. 10, no. 3, June 1996, pp. 129-135.
2. M. H. J. Bollen, D. D. Sabin, R. S. Thallan, "Voltage-sags indices - recent developments in IEEE P1564 Task Force," Proceedings of CIGRE/IEEE PES 2003, International Symposium on Quality and Security of Electric Power Delivery Systems, 8-10 October 2003, pp. 34-41.
3. M. H. J. Bollen, I. Gu: "Signal Processing of Power Quality Disturbances," Wiley-IEEE Press, 2006.
4. IEC 61000-4-30 "Electromagnetic compatibility (EMC) Part 4-30: Testing and measurement techniques - Power quality measurement methods," 2003.
5. Steven Kay, Fundamentals of Statistical Signal Processing, Volume 2: Detection Theory, Prentice Hall, 1998.
6. G. Ivchenko, Y. Medvedev, Mathematical Statistics, Mir Publishers Moskow, 1990.
7. E. Nunzi, L. Galleani, P. Tavella, P. Carbone, "Detection of Anomalies in the Behavior of Atomic Clocks," IEEE Transactions on Instrumentation and Measurement, Volume 56, N. 2, April 2007, pp. 523-528.
8. 2 MTC 2008, Victoria (Canada), 12-15 May 2008, pp. 1594-1597.
9. Abramowitz and Stegun: Handbook of Mathematical Functions.
10. N. Locci, C. Muscas, S. Sulis: "Converting specifications of DSP-based instruments into data suitable for Monte Carlo uncertainty estimation methods," IEEE AMUEM 2005, Niagara Falls (Canada), 13 May 2005, pp. 62-67.
11. E. Ghiani, N. Locci, C. Muscas, S. Sulis, "Uncertainty estimation for DSP-based power quality measurements," COMPEL, Vol. 23 No. 1, 2004, pp. 92-103.