Equivalence of digital image correlation criteria for pattern matching

Applied Optics

Volumn 49, Issue 28, 2010, Pages 5501-5509

  Pan, Bing ^a   Xie, Huimin ^b   Wang, Zhaoyang ^c  

^a BEIHANG UNIVERSITY   (China)

^b TSINGHUA UNIVERSITY   (China)

^c Catholic University of America ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN MATCHING; STRAIN MEASUREMENT;

ACTUAL EXPERIMENTS; CORRELATION CRITERION; D. DIGITAL IMAGE CORRELATION (DIC); DIGITAL IMAGE CORRELATIONS; NORMALIZED SUM OF SQUARED DIFFERENCES; POINT OF INTEREST; SUM OF SQUARED DIFFERENCES; ZERO-MEAN NORMALIZED CROSS CORRELATIONS;

IMAGE ANALYSIS;

EID: 77957551182     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.005501     Document Type: Article

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