Effect of test parameters on dynamic resistance measurement results from on-load tap changers

Conference Record of IEEE International Symposium on Electrical Insulation

Volumn , Issue , 2010, Pages

  Erbrink, J J ^a   Gulski, E ^a   Smit, J J ^a   Leich, R ^b   Seitz, P P ^c   Quak, B ^c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Liandon   (Netherlands)

^c Seitz Instruments AG   (Switzerland)

Author keywords

Aging; Contact resistance; Contacts; Diagnostic expert systems; Dynamic response; Power transformers; Resistance measurement

Indexed keywords

AGING; CIRCUIT RESISTANCE; CONTACTS; CURRENT AMPLITUDE; CURRENT INTERRUPTION; DIAGNOSTIC EXPERT SYSTEM; DYNAMIC RESISTANCE; ELECTRICAL CONTACTS; EXPERIMENTAL DATA; HIGH-SPEED; ON DYNAMICS; ON-LOAD TAP CHANGERS; PROS AND CONS; RESISTANCE MEASUREMENT; RESISTANCE TESTS; SIMULATION RESULT; TAP CHANGERS; TEST PARAMETERS; WINDING RESISTANCES;

CONTACT RESISTANCE; DEFECTS; DISTRIBUTED POWER GENERATION; DYNAMIC RESPONSE; ELECTRIC RESISTANCE MEASUREMENT; ELECTRIC TRANSFORMER TESTING; EXPERT SYSTEMS; POWER TRANSFORMERS; PROBLEM SOLVING; TECHNICAL PRESENTATIONS; TESTING; TRANSFORMER SUBSTATIONS; TRANSFORMER WINDINGS; VOLTAGE CONTROL; WINDING;

MEASUREMENTS;

EID: 77957366576     PISSN: 01642006     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ELINSL.2010.5549774     Document Type: Conference Paper

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