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Volumn 23, Issue 2, 2008, Pages 710-716

A complete strategy for conducting dynamic contact resistance measurements on HV circuit breakers

Author keywords

Arc byproducts; Circuit breakers (CBs); Dynamic contact resistance measurement; Metallic fluorides

Indexed keywords

CONTACT RESISTANCE; ELECTRIC ARCS; ELECTRIC RESISTANCE MEASUREMENT; QUENCHING;

EID: 42249103061     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2008.917694     Document Type: Article
Times cited : (97)

References (10)
  • 1
    • 42249090689 scopus 로고    scopus 로고
    • F. Salamanca, F. Borras, H. Eggert, and W. Steingräber, Preventive diagnosis on high-voltage circuit breakers, in Proc. CIGRE Symp. Berlin, Germany, 1993, pp. 120-02.
    • F. Salamanca, F. Borras, H. Eggert, and W. Steingräber, "Preventive diagnosis on high-voltage circuit breakers," in Proc. CIGRE Symp. Berlin, Germany, 1993, pp. 120-02.
  • 2
    • 42249087454 scopus 로고    scopus 로고
    • Condition-based maintenance techniques for EHV-class circuit breakers
    • presented at the, Boston, MA
    • R. Kumar Tyagi and N. Singh Sodha, "Condition-based maintenance techniques for EHV-class circuit breakers," presented at the Doble Client Conf., Boston, MA, 2001.
    • (2001) Doble Client Conf
    • Kumar Tyagi, R.1    Singh Sodha, N.2
  • 6
    • 42249106346 scopus 로고
    • 6 gas circuit breakers and the repair procedures implemented
    • presented at the, Boston, MA
    • 6 gas circuit breakers and the repair procedures implemented," presented at the Doble Conf., Boston, MA, 1994.
    • (1994) Doble Conf
    • Koch, D.1    Garzon, R.2
  • 7
    • 42249097406 scopus 로고
    • 6 gas circuit breakers and the repair procedures implemented
    • presented at the, Boston, MA
    • 6 gas circuit breakers and the repair procedures implemented," presented at the Doble Conf., Boston, MA, 1994.
    • (1994) Doble Conf
    • Hanson, W.B.1
  • 10
    • 42249092210 scopus 로고    scopus 로고
    • W. Hayt H, Engineering Electromagnetics, 2nd ed. New York: Mc-Graw-Hill, ch. 8, p. 258.
    • W. Hayt H, Engineering Electromagnetics, 2nd ed. New York: Mc-Graw-Hill, ch. 8, p. 258.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.