Characterization of tetragonal SAT0.3: LA0.075: CAT0.625 perovskite crystal: Spectroscopic andmicroscopic investigations

Journal of Raman Spectroscopy

Volumn 41, Issue 9, 2010, Pages 1030-1037

  Runka, T ^a   Diduszko, R ^b,c   Berkowski, M ^c   Kaminski M ^a   Lapinski A ^d   Polomska, M ^d   Drozdowski, M ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b TELE AND RADIO RESEARCH INSTITUTE   (Poland)

^c INSTITUTE OF PHYSICS   (Poland)

^d INSTITUTE OF MOLECULAR PHYSICS   (Poland)

Author keywords

Atomic force microscopy; Optical microscopy; Perovskite crystals; Raman microscopy; XRD diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; DEPTH PROFILING; GROUP THEORY; LIGHT ABSORPTION; LIGHT TRANSMISSION; PEROVSKITE; SENSITIVITY ANALYSIS; SINGLE CRYSTALS; TEMPERATURE MEASUREMENT;

ATOMIC-FORCE-MICROSCOPY; MEASUREMENTS OF; MICRO RAMAN SPECTROSCOPY; MICROSCOPY ATOMIC FORCE; PEROVSKITE CRYSTAL; RAMAN MICROSCOPY; STRUCTURE REFINEMENTS; TRANSMISSION MICROSCOPY; X- RAY DIFFRACTIONS; X-RAY DIFFRACTION DIFFRACTION;

X RAY DIFFRACTION;

EID: 77957357794     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.2553     Document Type: Article

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