Temperature Raman scattering study of CaAl0.5Ta0.5O3 perovskite crystal

Journal of Physics and Chemistry of Solids

Volumn 69, Issue 7, 2008, Pages 1646-1651

  Runka, T ^a   Berkowski, M ^b   Lapinski A ^c   Drozdowski, M ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF PHYSICS   (Poland)

^c INSTITUTE OF MOLECULAR PHYSICS   (Poland)

Author keywords

A. Inorganic compounds; C. Raman spectroscopy; D. Microstructure

Indexed keywords

CRYSTAL STRUCTURE; MICROSTRUCTURE; RAMAN SCATTERING; TEMPERATURE DISTRIBUTION;

MICRO-RAMAN SYSTEMS; OCTAHEDRAL TILTING;

PEROVSKITE;

EID: 44549087525     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2007.12.011     Document Type: Article

References (15)

1. Berkowski M., Aleksiyko R., Fink-Finowicki J., Diduszko R., Byszewski P., and Kikaleshvili-Domukhovska R. J. Cryst. Growth 269 (2004) 512-517
2. Diamond Version 2.1c (Visual Crystal Structure Information System).
3. Megaw H.D. Cryst. Struct.: A Working Approach (1973), W.B. Saunders Co., Philadelphia, PA
4. Howard C.J., and Stokes H.T. Acta Crystallogr. B 60 (2004) 674-684
5. Glazer A.M. Acta Crystallogr. B 28 (1972) 3384-3392
6. Woodward P. Acta Crystallogr. B 53 (1997) 32-43
7. Levin I., Chan J.Y., Maslar J.E., Vanderah T.A., and Bell S.M. J. Appl. Phys. 90 (2001) 904-914
8. Runka T., Berkowski M., and Drozdowski M. J. Mol. Struct. 792-793 (2006) 221-226
9. T. Runka, M. Berkowski, M. Drozdowski, J. Mol. Struct., in press. doi:10.1016/j.molstruc.2007.05.047.
10. Runka T., Łapsa K., Łapiński A., Aleksiyko R., Berkowski M., and Drozdowski M. J. Mol. Struct. 704 (2004) 281-285
11. Siny G., Tao R., Katiyar R.S., Guo R., and Bhalla A.S. J. Phys. Chem. Solids 59 (1998) 181-195
12. Zaghrioui M., Bulou A., Lacorre P., and Laffez P. Phys. Rev. B 64 (2001) 081102-1-081102-4
13. Prosandeev S.A., Waghmare U., Levin I., and Maslar J. Phys. Rev. B 71 (2005) 214307-1-214307-9
14. Tao R., Guo A.R., Tu C.-S., Siny I., Katiyar R.S., Guo R., and Bhalla A.S. Ferroelectrics Lett. 21 (1996) 79-85
15. Ratheesh R., Wöhlecke M., Berge B., Wahlbrink T.h., Haeuseler H., Rühl E., Blachnik R., Balan P., Santha N., and Sebastian M.T. J. Appl. Phys. 88 (2000) 2813-2818