Raman and X-ray diffraction analysis on unburned carbon powder refined from fly ash

Journal of Raman Spectroscopy

Volumn 41, Issue 9, 2010, Pages 933-937

  Tai, F C ^a   Wei, C ^b   Chang, S H ^c   Chen, W S ^d  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b TATUNG UNIVERSITY   (Taiwan)

^c NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^d NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Crystalline width; D' peak; Interlayer spacing; Ratio

Indexed keywords

FLY ASH; GRAPHITE; GRAPHITIZATION; POWDERS; RAMAN SCATTERING; X RAY DIFFRACTION ANALYSIS;

BONDING STRUCTURE; CARBON POWDER; CRYSTALLINE WIDTH; D' PEAK; INTERLAYER SPACINGS; RATIO; SPECTRAL LINESHAPES; UNBURNED CARBONS; X- RAY DIFFRACTIONS; X-RAY DIFFRACTION SPECTRUM;

CRYSTALLINE MATERIALS;

EID: 77957354356     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.2532     Document Type: Article

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