Erratum: Specification for a standard procedure of X-ray diffraction measurements on carbon materials (Carbon (2004) 42 (701-714) DOI: 10.1016/j.carbon.2004.02.008);Specification for a standard procedure of X-ray diffraction measurements on carbon materials

Carbon

Volumn 42, Issue 4, 2004, Pages 701-714

  Iwashita, Norio ^a   Park, Chong Rae ^b   Fujimoto, Hiroyuki ^c   Shiraishi, Minoru ^d   Inagaki, Michio ^e  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b Seoul National University   (South Korea)

^c OSAKA GAS CO LTD   (Japan)

^d TOKAI UNIVERSITY   (Japan)

^e AICHI INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

B: Graphitization; C: X ray diffraction; D: Crystal structure

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; GRAPHITIZATION; HEAT TREATMENT; LATTICE CONSTANTS; SCANNING; SILICON; X RAY DIFFRACTION ANALYSIS;

ATOMIC SCATTERING FACTOR; DIFFRACTION LINES;

CARBON;

EID: 1642284305     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2004.05.027     Document Type: Erratum

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