Full multiple scattering analysis of XANES at the Cd L3 and OK edges in CdO films combined with a soft-x-ray emission investigation

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 7, 2010, Pages

  Demchenko, I N ^a,b,c   Denlinger, J D ^b   Chernyshova, M ^d   Yu, K M ^b   Speaks, D T ^b,e   Olalde Velasco, P ^b,f   Hemmers, O ^a   Walukiewicz, W ^b   Derkachova, A ^c   Lawniczak Jablonska, K ^c  

^a UNIVERSITY OF NEVADA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c INSTITUTE OF PHYSICS   (Poland)

^d SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^e Lawrence Berkeley National Laboratory   (United States)

^f UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957337452     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.075107     Document Type: Article

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