Resonant inelastic soft X-ray scattering at the Si L3 edge: Experiment and theory

Journal of Electron Spectroscopy and Related Phenomena

Volumn 93, Issue 1-3, 1998, Pages 245-250

  Eisebitt, S ^a   Luning J ^a   Rubensson, J E ^a   Settels, A ^a   Dederichs, P H ^a   Eberhardt, W ^a   Patitsas, S N ^b   Tiedje, T ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009326798     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(98)00182-0     Document Type: Article

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