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Materials Research Bulletin

Volumn 45, Issue 11, 2010, Pages 1696-1702

Growth morphology study of cathodically electrodeposited Fe 3O4 thin films at elevated temperatures

(4) Duan, Huanan a Chen, Xiangping a,b Li, Boquan a Liang, Jianyu a

a Worcester Polytechnic Institute (United States)

b SOUTH CHINA UNIVERSITY OF TECHNOLOGY (China)

Author keywords

A. Magnetic materials; C. Electron microscopy; C. X ray diffraction; D. Microstructure

Indexed keywords

A. MAGNETIC MATERIALS; C. ELECTRON MICROSCOPY; CONCENTRATION OF FE; D. MICROSTRUCTURE; DEPOSITION TEMPERATURES; ELEVATED TEMPERATURE; GALVANOSTATIC DEPOSITION; GROWTH MODELS; GROWTH MORPHOLOGY; HIGH TEMPERATURE; LOW TEMPERATURES; SIGNIFICANT IMPACTS; TRIETHANOLAMINES;

DIFFRACTION; ELECTRODEPOSITION; MAGNETIC DEVICES; MAGNETIC MATERIALS; MICROSTRUCTURE; MORPHOLOGY; VAPOR DEPOSITION; X RAY DIFFRACTION;

THIN FILMS;

EID: 77957314111 PISSN: 00255408 EISSN: None Source Type: Journal
DOI: 10.1016/j.materresbull.2010.06.065 Document Type: Article

Times cited : (16)

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