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Volumn 82, Issue 3, 2010, Pages

Precise half-life measurement of the superallowed β+ emitter Si26

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Indexed keywords


EID: 77957297746     PISSN: 05562813     EISSN: 1089490X     Source Type: Journal    
DOI: 10.1103/PhysRevC.82.035502     Document Type: Article
Times cited : (19)

References (22)
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