Precise half-life measurement of the 26Si ground state

European Physical Journal A

Volumn 37, Issue 2, 2008, Pages 151-158

  Matea, I ^a   Souin, J ^a,b   Aysto J ^c   Blank, B ^a   Delahaye, P ^d   Elomaa, V V ^c   Eronen, T ^c   Giovinazzo, J ^a   Hager, U ^c,e   Hakala, J ^c   Huikari, J ^a   Jokinen, A ^c   Kankainen, A ^c   Moore, I D ^c   Pedroza, J L ^a   Rahaman, S ^c   Rissanen, J ^c   Ronkainen, J ^c   Saastamoinen, A ^c   Sonoda, T ^c,f   Weber, C ^c   more..

^a CENTRE D ETUDES NUCLÉAIRES DE BORDEAUX GRADIGNAN   (France)

^b INSTITUTO DE ESTRUCTURA DE LA MATERIA   (Spain)

^c UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^d CERN   (Switzerland)

^e TRIUMF   (Canada)

^f KU LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 52149106667     PISSN: 14346001     EISSN: None     Source Type: Journal    
DOI: 10.1140/epja/i2008-10623-5     Document Type: Article

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