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Volumn 38, Issue C, 1993, Pages 117-187

Local Vibrational Mode Spectroscopy of Defects in III/V Compounds

Author keywords

[No Author keywords available]

Indexed keywords

LOCAL VIBRATIONAL MODE;

EID: 77956955945     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)62800-8     Document Type: Article
Times cited : (55)

References (196)
  • 4
    • 85023562783 scopus 로고
    • GaAs Proc. 2nd Int. Symp. Dallas, p. 66. Inst. of Phys.
    • W.P. Allred, G. Cumming, J. Kung, and W.G. Spitzer, (1969). GaAs Proc. 2nd Int. Symp. Dallas, p. 66. Inst. of Phys.
    • (1969)
    • Allred, W.P.1    Cumming, G.2    Kung, J.3    Spitzer, W.G.4
  • 7
    • 85023510679 scopus 로고
    • ). 20th Int. Conf. Phys. Semicond. Aug., Thessaloniki. E. M. Anastassakis and J. D. Joannopoulos eds. (World Scientific: Singapore) I p 734.
    • ). 20th Int. Conf. Phys. Semicond. Aug. 1990, Thessaloniki. E. M. Anastassakis and J. D. Joannopoulos eds. (World Scientific: Singapore) I p 734.
    • (1990)
  • 9
    • 85023556665 scopus 로고
    • 5th Conf. on Semi-insulating III-V Materials, Malmö, Sweden, p. 201. Adam Hilger, Bristol.
    • T. Arai, T. Nozaki, J. Osaka, and M. Tajima, (1988). 5th Conf. on Semi-insulating III-V Materials, Malmö, Sweden, p. 201. Adam Hilger, Bristol.
    • (1988)
    • Arai, T.1    Nozaki, T.2    Osaka, J.3    Tajima, M.4
  • 12
    • 85023452539 scopus 로고
    • and A.J. Sievers. Rev. Mod. Phys. 47: Suppl. No. 2.
    • A.S. Barker, Jr., and A.J. Sievers (1975). Rev. Mod. Phys. 47: Suppl. No. 2.
    • (1975)
    • Barker, A.S.1
  • 14
    • 85023501438 scopus 로고
    • Ph.D thesis, University of Reading.
    • R.B. Beall, (1985). Ph.D thesis, University of Reading.
    • (1985)
    • Beall, R.B.1
  • 26
    • 85023529885 scopus 로고
    • 4th Int. Conf. Shallow Impurities in Semiconductors, July 1990, London. Mater. Sci. Forum (Transtech Publications: Switzerland), 65–66, 169.
    • P. Briddon, R. Jones, (1991). 4th Int. Conf. Shallow Impurities in Semiconductors, July 1990, London. Mater. Sci. Forum (Transtech Publications: Switzerland), 65–66, 169.
    • (1991)
    • Briddon, P.1    Jones, R.2
  • 38
    • 3342964371 scopus 로고
    • Neutralization of Defects and Dopants in III/V Semiconductors, Semicond. and Semimetals, (J. I. Pankove and N. M. Johnson eds) vol. 34, p. 447.
    • J. Chevallier, B. Clerjaud, and B. Pajot, (1991). Neutralization of Defects and Dopants in III/V Semiconductors, Semicond. and Semimetals, (J. I. Pankove and N. M. Johnson eds) vol. 34, p. 447.
    • (1991)
    • Chevallier, J.1    Clerjaud, B.2    Pajot, B.3
  • 44
    • 0004893209 scopus 로고
    • Phys. Reports 176: (3 and 4), 83.
    • G. Davies, (1989). Phys. Reports 176: (3 and 4), 83.
    • (1989)
    • Davies, G.1
  • 45
    • 0344390361 scopus 로고
    • S.T. Pantelides Gordon and Breach New York.
    • Dean, P.J., Pantelides, S.T., (eds.) Deep Centers in Semiconductors, 1986, Gordon and Breach, New York., 185–347.
    • (1986) Deep Centers in Semiconductors , pp. 185-347
    • Dean, P.J.1
  • 52
    • 2842515744 scopus 로고
    • Fano, U., Phys. Rev., 124, 1961, 1866.
    • (1961) Phys. Rev. , vol.124 , pp. 1866
    • Fano, U.1
  • 57
    • 84958517826 scopus 로고    scopus 로고
    • 1989 7th Int. Conf. on Fourier Transform Spectroscopy, Fairfax, Virginia, June 19–23, SPIE Vol. 1145, pp. 553.
    • G.A. Gledhill, S.B. Upadhyay, M.R. Brozel, and R.C. Newman, 1989 7th Int. Conf. on Fourier Transform Spectroscopy, Fairfax, Virginia, June 19–23, SPIE Vol. 1145, pp. 553.
    • Gledhill, G.A.1    Upadhyay, S.B.2    Brozel, M.R.3    Newman, R.C.4
  • 62
    • 85023484175 scopus 로고
    • H.J. von Bardeleben Transtech Switzerland. Mat. Sci. Forum
    • Hage, J., Niklas, J.R., Spaeth, J.-M., von Bardeleben, H.J., (eds.) Defects in Semiconductors, 1986, Transtech, Switzerland., 259 Mat. Sci. Forum.
    • (1986) Defects in Semiconductors , pp. 259
    • Hage, J.1    Niklas, J.R.2    Spaeth, J.-M.3
  • 63
    • 85023453441 scopus 로고
    • O. Madelung M. Schulz Springer Verlag Berlin.
    • Hamilton, B., Madelung, O., Schulz, M., (eds.) Landolt-Börnstein, 22b, 1989, Springer Verlag, Berlin., 583–594.
    • (1989) Landolt-Börnstein , vol.22b , pp. 583-594
    • Hamilton, B.1
  • 75
    • 85023488320 scopus 로고
    • O. Madelung M. Schulz Springer Verlag Berlin.
    • Kaufmann, U., Madelung, O., Schulz, M., (eds.) Landolt-Börnstein, 22b, 1989, Springer Verlag, Berlin., 607.
    • (1989) Landolt-Börnstein , vol.22b , pp. 607
    • Kaufmann, U.1
  • 80
    • 0021820724 scopus 로고
    • L.C. Kimerling J.M. Parsey Jr. AIME, Warrendale Pennsylvania.
    • Kennedy, T.A., Wilsey, N.D., Kimerling, L.C., Parsey, J.M. Jr., (eds.) Defects in Semiconductors, 1985, AIME, Warrendale, Pennsylvania., 929.
    • (1985) Defects in Semiconductors , pp. 929
    • Kennedy, T.A.1    Wilsey, N.D.2
  • 104
    • 85023503417 scopus 로고
    • Int. Conf. on Sci. & Technol. of Defect Control in Semicond., Yokohama, Japan. K. Sumino ed. (North Holland: Amsterdam) p. 1043, Vol. II.
    • M. Mizuta, (1990). Int. Conf. on Sci. & Technol. of Defect Control in Semicond., Yokohama, Japan. K. Sumino ed. (North Holland: Amsterdam) p. 1043, Vol. II.
    • (1990)
    • Mizuta, M.1
  • 111
    • 85023470630 scopus 로고
    • O. Madelung M. Schulz Springer-Verlag Berlin. and 576–583.
    • Murray, R., Newman, R.C., Madelung, O., Schulz, M., (eds.) Landolt-Börnstein, 22b, 1989, Springer-Verlag, Berlin., 105–113 and 576–583.
    • (1989) Landolt-Börnstein , vol.22b , pp. 105-113
    • Murray, R.1    Newman, R.C.2
  • 121
    • 85023468290 scopus 로고
    • L.C. Kimerling J.M. Parsey Jr. AIME, Warrendale Pennsylvania.
    • Newman, R.C., Kimerling, L.C., Parsey, J.M. Jr., (eds.) Defects in Semiconductors, 1985, AIME, Warrendale, Pennsylvania., 87.
    • (1985) Defects in Semiconductors , pp. 87
    • Newman, R.C.1
  • 122
    • 84951260918 scopus 로고
    • P.A. Glasow Y.I. Nissim J.P. Noblanc J. Speight les éditions de physique: Les Ulis France
    • Newman, R.C., Glasow, P.A., Nissim, Y.I., Noblanc, J.P., Speight, J., (eds.) Advanced Materials for Telecom, E-MRS, XIII, 1986, les éditions de physique: Les Ulis, France, 99.
    • (1986) Advanced Materials for Telecom, E-MRS, XIII , pp. 99
    • Newman, R.C.1
  • 139
    • 85023481612 scopus 로고
    • In II-VI Int. Conf. on Semiconducting Compounds (D. G. Thomas, ed.), p. 40. Benjamin, New York.
    • J. Schneider, (1967). In II-VI Int. Conf. on Semiconducting Compounds (D. G. Thomas, ed.), p. 40. Benjamin, New York.
    • (1967)
    • Schneider, J.1
  • 140
    • 85023528712 scopus 로고
    • O. Madelung M. Schulz Springer-Verlag Berlin.
    • Schneider, J., Madelung, O., Schulz, M., (eds.) Landolt-Börnstein, 22b, 1989, Springer-Verlag, Berlin., 123–126.
    • (1989) Landolt-Börnstein , vol.22b , pp. 123-126
    • Schneider, J.1
  • 168
    • 0002478487 scopus 로고
    • T.S. Moss S.P. Keller North-Holland Amsterdam.
    • van Vechten, J.A., Moss, T.S., Keller, S.P., (eds.) Handbook on Semiconductors, 3, 1980, North-Holland, Amsterdam., 1–111.
    • (1980) Handbook on Semiconductors , vol.3 , pp. 1-111
    • van Vechten, J.A.1
  • 173
    • 85023593449 scopus 로고
    • (Les Editions de Physique, Les Ulis, France)
    • Wagner, J., Ramsteiner, M., Proc. E-MRS, 16, 1987, 243 (Les Editions de Physique, Les Ulis, France).
    • (1987) Proc. E-MRS , vol.16 , pp. 243
    • Wagner, J.1    Ramsteiner, M.2
  • 183
    • 77957078386 scopus 로고
    • R.K. Willardson A.C. Beer Academic Press New York.
    • Williams, E.W., Bebb, H.B., Willardson, R.K., Beer, A.C., (eds.) Semicond. and Semimetals, 8, 1972, Academic Press, New York., 321.
    • (1972) Semicond. and Semimetals , vol.8 , pp. 321
    • Williams, E.W.1    Bebb, H.B.2


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