High resolution ftir study of lvms due to c in gaas: Measurement of internal strains and structure of the c(1) lines

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1145, Issue , 1989, Pages 553-555

  Gledhill, G A ^a   Upadhyay, S B ^a   Brozela, M R ^b   Newman, R C ^c  

^a UNIVERSITY OF LONDON   (United Kingdom)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84958517826     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.969598     Document Type: Conference Paper

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