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Volumn 82, Issue 3, 2010, Pages

Resonant escape over an oscillating barrier in a single-electron ratchet transfer

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EID: 77956707977     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.033303     Document Type: Article
Times cited : (26)

References (38)
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    • It is ensured that single-electron trapping from the source is robust against continuous application of the weak rf signal
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    • The higher-frequency region could not be investigated due to the frequency limitation in our measurement system
    • The higher-frequency region could not be investigated due to the frequency limitation in our measurement system.
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    • The inverted cusplike pattern observed in the higher-frequency regime indicates the presence of signal interference between the signal generator and the device. However, such an overall shift of the resonant behavior cannot be explained by the signal interference.
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    • The fractional deviation in the low-frequency regime is mainly due to the double-exponential fitting within the finite measurement window.


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