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Journal of Power Sources

Volumn 196, Issue 1, 2011, Pages 465-469

Criterion for insertion-induced microcracking and debonding of thin films

(1) Yang, Fuqian a

a UNIVERSITY OF KENTUCKY (United States)

Author keywords

Cracking; Debonding; Insertion; Strain energy

Indexed keywords

ANALYTICAL RELATIONS; CRACKING; CRITICAL CONCENTRATION; DAMAGE SIZE; ELASTIC FILMS; ENERGY PRINCIPLES; EXPERIMENTAL OBSERVATION; INDUCED STRESS; INSERTION; LITHIUM-ION BATTERY; LOCAL BUCKLING; NUMERICAL RESULTS; SOLUTE ATOMS; STRUCTURAL DAMAGES; SURFACE CRACKING; VOLUME EXPANSION; YOUNG'S MODULUS;

COMPRESSIVE STRESS; CRACKING (CHEMICAL); DEBONDING; LITHIUM; LITHIUM ALLOYS; MICROCRACKING; STRAIN ENERGY; SURFACE DEFECTS; TENSILE STRESS;

BUCKLING;

EID: 77956697940 PISSN: 03787753 EISSN: None Source Type: Journal
DOI: 10.1016/j.jpowsour.2010.06.082 Document Type: Article

Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.